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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
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  • English
  • Year: 1986
  • Author: Dale E. Newbury, David C. Joy, Patrick Echlin, Charles E. Fiori, Joseph I. Goldstein (auth.)
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook
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  • English
  • Year: 1990
  • Author: Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury, David B. Williams, John T. Armstrong, Charles E. Fiori, Eric Lifshin, Klaus-Ruediger Peters (auth.)
Scanning electron microscopy and x-ray microanalysis
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  • English
  • Year: 2017;2018
  • Author: Goldstein, Joseph; Joy, David C.; Michael, Joseph R.; Newbury, Dale E.; Ritchie, Nicholas W. M.; Scott, John Henry J
X-Ray Spectrometry in Electron Beam Instruments
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  • English
  • Year: 1995
  • Author: K. F. J. Heinrich (auth.), David B. Williams, Joseph I. Goldstein, Dale E. Newbury (eds.)
Electron Probe Quantitation
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  • English
  • Year: 1991
  • Author: R. Castaing (auth.), K. F. J. Heinrich, Dale E. Newbury (eds.)
The Handbook of Graphene Electrochemistry
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  • English
  • Year: 2014
  • Author: Dale A. C. Brownson, Craig E. Banks (auth.)
Helium Ion Microscopy: Principles and Applications
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  • English
  • Year: 2013
  • Author: David C. Joy (auth.)
EXAFS Spectroscopy: Techniques and Applications
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  • English
  • Year: 1981
  • Author: E. A. Stern (auth.), B. K. Teo, D. C. Joy (eds.)
Regression Methods in Biostatistics: Linear, Logistic, Survival, and Repeated Measures Models
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  • English
  • Year: 2005
  • Author: Eric Vittinghoff, Stephen C. Shiboski, David V. Glidden, Charles E. McCulloch (auth.)
Regression Methods in Biostatistics: Linear, Logistic, Survival, and Repeated Measures Models
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  • English
  • Year: 2012
  • Author: Eric Vittinghoff, David V. Glidden, Stephen C. Shiboski, Charles E. McCulloch (auth.)
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