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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
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  • Year: 1986
  • Author: Dale E. Newbury, David C. Joy, Patrick Echlin, Charles E. Fiori, Joseph I. Goldstein (auth.)
Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologist, Materials Scientist, and Geologists
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  • English
  • Year: 1981
  • Author: Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin (auth.)
Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
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  • English
  • Year: 1992
  • Author: Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, A. D. Romig Jr., Charles E. Lyman, Charles Fiori, Eric Lifshin (auth.)
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook
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  • English
  • Year: 1990
  • Author: Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury, David B. Williams, John T. Armstrong, Charles E. Fiori, Eric Lifshin, Klaus-Ruediger Peters (auth.)
Scanning Electron Microscopy and X-ray Microanalysis
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  • English
  • Year: 2003
  • Author: Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
Scanning electron microscopy and x-ray microanalysis
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  • English
  • Year: 2017;2018
  • Author: Goldstein, Joseph; Joy, David C.; Michael, Joseph R.; Newbury, Dale E.; Ritchie, Nicholas W. M.; Scott, John Henry J
X-Ray Spectrometry in Electron Beam Instruments
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  • English
  • Year: 1995
  • Author: K. F. J. Heinrich (auth.), David B. Williams, Joseph I. Goldstein, Dale E. Newbury (eds.)
Practical Scanning Electron Microscopy: Electron and Ion Microprobe Analysis
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  • English
  • Year: 1975
  • Author: J. I. Goldstein, H. Yakowitz, D. E. Newbury (auth.), Joseph I. Goldstein, Harvey Yakowitz (eds.)
Electron Probe Quantitation
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  • English
  • Year: 1991
  • Author: R. Castaing (auth.), K. F. J. Heinrich, Dale E. Newbury (eds.)
Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
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  • English
  • Year: 2009
  • Author: Patrick Echlin (auth.)
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