Scanning electron microscopy and x-ray microanalysis
- Author
- Goldstein, JosephJoy, David C.Michael, Joseph R.Newbury, Dale E.Ritchie, Nicholas W. M.Scott, John Henry J
- Publisher
- Springer
- Language
- English
- Edition
- Fourth edition
- Year
- 2017;2018
- Page
- xxiii, 550 pages: illustrations (some color
- ISBN
- 9781493966745,9781493966769,2017943045,149396674X,1493966766
- File Type
- pdf
- File Size
- 73.5 MiB
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