Scanning Electron Microscopy and X-ray Microanalysis
- Author
- Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
- Publisher
- Springer
- Language
- English
- Edition
- 3rd
- Year
- 2003
- Page
- 361
- ISBN
- 0306472929,9780306472923
- File Type
- pdf
- File Size
- 166.1 MiB
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