Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook
- Author
- Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury, David B. Williams, John T. Armstrong, Charles E. Fiori, Eric Lifshin, Klaus-Ruediger Peters (auth.)
- Publisher
- Springer US
- Language
- English
- Edition
- 1
- Year
- 1990
- Page
- 407
- ISBN
- 978-0-306-43591-1,978-1-4613-0635-1
- File Type
- pdf
- File Size
- 28.1 MiB
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