Advanced Scanning Electron Microscopy and X-Ray Microanalysis
- Author
- Dale E. Newbury, David C. Joy, Patrick Echlin, Charles E. Fiori, Joseph I. Goldstein (auth.)
- Publisher
- Springer US
- Language
- English
- Edition
- 1
- Year
- 1986
- Page
- 454
- ISBN
- 978-1-4757-9029-0,978-1-4757-9027-6
- File Type
- pdf
- File Size
- 21.8 MiB
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