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Defect Oriented Testing for CMOS Analog and Digital Circuits
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  • English
  • Year: 1999
  • Author: Manoj Sachdev (auth.)
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: 2nd Edition
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  • English
  • Year: 2007
  • Author: Manoj Sachdev, José Pineda de Gyvez (auth.), Manoj Sachdev, José Pineda de Gyvez (eds.)
Thermal and Power Management of Integrated Circuits
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  • English
  • Year: 2006
  • Author: Arman Vassighi, Manoj Sachdev
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test
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  • English
  • Year: 2008
  • Author: Andrei Pavlov, Manoj Sachdev
Success of University Spin-Offs: Network Activities and Moderating Effects of Internal Communication and Adhocracy
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  • English
  • Year: 2007
  • Author: Manoj A. Gupte (auth.)
Indian Ocean Region: Maritime Regimes for Regional Cooperation
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  • English
  • Year: 2010
  • Author: Manoj Gupta (auth.)
Multiscalar Processors
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  • English
  • Year: 2003
  • Author: Manoj Franklin (auth.)
Large Time Asymptotics for Solutions of Nonlinear Partial Differential Equations
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  • English
  • Year: 2010
  • Author: P.L. Sachdev, Ch. Srinivasa Rao (auth.)
Large time asymptotics for solutions of nonlinear partial differential equations
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  • English
  • Year: 2010
  • Author: P.L. Sachdev, Ch. Srinivasa Rao (auth.)
Large Time Asymptotics for Solutions of Nonlinear Partial Differential Equations
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  • English
  • Year: 2010
  • Author: P.L. Sachdev, Ch. Srinivasa Rao (auth.)
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