Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: 2nd Edition
- Author
- Manoj Sachdev, José Pineda de Gyvez (auth.), Manoj Sachdev, José Pineda de Gyvez (eds.)
- Publisher
- Springer US
- Language
- English
- Edition
- 2
- Year
- 2007
- Page
- 328
- ISBN
- 978-0-387-46546-3,978-0-387-46547-0
- File Type
- pdf
- File Size
- 6.0 MiB
How to Download?!!!
Just click on START button on Telegram Bot