CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test
- Author
- Andrei Pavlov, Manoj Sachdev
- Publisher
- Springer
- Language
- English
- Edition
- 1
- Year
- 2008
- Page
- 202
- ISBN
- 1402083629,9781402083624,9781402083631
- File Type
- pdf
- File Size
- 7.8 MiB
How to Download?!!!
Just click on START button on Telegram Bot