Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
- Author
- Manoj Sachdev, José Pineda de Gyvez
- Publisher
- Springer
- Language
- English
- Edition
- 2
- Year
- 2007
- Page
- 342
- ISBN
- 9780387249933,0387249931
- File Type
- pdf
- File Size
- 5.8 MiB
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