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Power-Aware Testing and Test Strategies for Low Power Devices
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  • Year: 2010
  • Author: Laung-Terng Wang, Charles E. Stroud (auth.), Patrick Girard, Nicola Nicolici, Xiaoqing Wen (eds.)
Power-Aware Testing and Test Strategies for Low Power Devices
  • PDF
  • English
  • Year: 2010
  • Author: Laung-Terng Wang, Charles E. Stroud (auth.), Patrick Girard, Nicola Nicolici, Xiaoqing Wen (eds.)
System-on-Chip Test Architectures: Nanometer Design for Testability (Systems on Silicon)
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  • English
  • Year: 2007
  • Author: Laung-Terng Wang, Charles E. Stroud, Nur A. Touba
VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)
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  • English
  • Year: 2006
  • Author: Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
VLSI Test Principles and Architectures: Design for Testability
  • PDF
  • English
  • Year: 2006
  • Author: Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
VLSI Test Principles and Architectures: Design for Testability
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  • English
  • Year: 2006
  • Author: Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
Electronic Design Automation: Synthesis, Verification, and Test (Systems on Silicon)
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  • English
  • Year: 2009
  • Author: Laung-Terng Wang, Yao-Wen Chang, Kwang-Ting (Tim) Cheng
Power-constrained Testing of VLSI Circuits
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  • English
  • Year: 2004
  • Author: Nicola Nicolici, Bashir M. Al-Hashimi (auth.)
A Designer s Guide to Built-in Self-Test
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  • English
  • Year: 2002
  • Author: Charles E. Stroud
Dynamic Formal Epistemology
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  • English
  • Year: 2011
  • Author: Patrick Girard, Mathieu Marion, Olivier Roy (auth.), Patrick Girard, Olivier Roy, Mathieu Marion (eds.)
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