VLSI Test Principles and Architectures: Design for Testability
- Author
- Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
- Publisher
- Morgan Kaufmann
- Language
- English
- Edition
- 1
- Year
- 2006
- Page
- 809
- ISBN
- 9780123705976,0123705975
- File Type
- pdf
- File Size
- 5.7 MiB
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