Power-constrained Testing of VLSI Circuits
- Author
- Nicola Nicolici, Bashir M. Al-Hashimi (auth.)
- Publisher
- Springer US
- Language
- English
- Edition
- 1
- Year
- 2004
- Page
- 178
- ISBN
- 978-1-4020-7235-2,978-0-306-48731-6
- File Type
- pdf
- File Size
- 14.2 MiB
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