System-on-Chip Test Architectures: Nanometer Design for Testability (Systems on Silicon)
- Author
- Laung-Terng Wang, Charles E. Stroud, Nur A. Touba
- Publisher
- Morgan Kaufmann
- Language
- English
- Year
- 2007
- Page
- 893
- ISBN
- 012373973X,9780123739735,9780080556802
- File Type
- pdf
- File Size
- 9.9 MiB
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