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System-on-Chip Test Architectures: Nanometer Design for Testability (Systems on Silicon)
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  • English
  • Year: 2007
  • Author: Laung-Terng Wang, Charles E. Stroud, Nur A. Touba
Power-Aware Testing and Test Strategies for Low Power Devices
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  • English
  • Year: 2010
  • Author: Laung-Terng Wang, Charles E. Stroud (auth.), Patrick Girard, Nicola Nicolici, Xiaoqing Wen (eds.)
Power-Aware Testing and Test Strategies for Low Power Devices
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  • English
  • Year: 2010
  • Author: Laung-Terng Wang, Charles E. Stroud (auth.), Patrick Girard, Nicola Nicolici, Xiaoqing Wen (eds.)
VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)
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  • English
  • Year: 2006
  • Author: Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
VLSI Test Principles and Architectures: Design for Testability
  • PDF
  • English
  • Year: 2006
  • Author: Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
VLSI Test Principles and Architectures: Design for Testability
  • PDF
  • English
  • Year: 2006
  • Author: Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
Electronic Design Automation: Synthesis, Verification, and Test (Systems on Silicon)
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  • English
  • Year: 2009
  • Author: Laung-Terng Wang, Yao-Wen Chang, Kwang-Ting (Tim) Cheng
A Designer s Guide to Built-in Self-Test
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  • English
  • Year: 2002
  • Author: Charles E. Stroud
A Natural History of the Common Law
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  • English
  • Year: 2003;2011
  • Author: Milsom, Stroud Francis Charles