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X-ray metrology in semiconductor manufacturing
  • PDF
  • English
  • Year: 2006
  • Author: D. Keith Bowen, Brian K. Tanner
Characterization of Crystal Growth Defects by X-Ray Methods
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  • English
  • Year: 1980
  • Author: Eugene S. Meieran (auth.), Dr. Brian K. Tanner, Dr. D. Keith Bowen (eds.)
High resolution X-ray diffractometry and topography
  • PDF
  • English
  • Year: 1998
  • Author: D.K. Bowen, Brian K. Tanner
Introduction to the physics of electrons in solids [...] XD-US
  • DJVU
  • English
  • Year: 1995
  • Author: Brian K Tanner
X-ray and neutron dynamic diffraction
  • DJVU
  • English
  • Year: 1997
  • Author: André Authier, Stefano Lagomarsino, Brian K. Tanner
The American Construction Industry: Its Historical Evolution and Potential Future
  • PDF
  • English
  • Year: 2021
  • Author: Brian Bowen
Microscopy of Materials: Modern Imaging Methods Using Electron, X-ray and Ion Beams
  • PDF
  • English
  • Year: 1975
  • Author: D. K. Bowen, C. R. Hall (auth.)
X-Ray and Neutron Dynamical Diffraction: Theory and Applications
  • PDF
  • English
  • Year: 1996
  • Author: A. Authier (auth.), André Authier, Stefano Lagomarsino, Brian K. Tanner (eds.)
Advances in X-Ray Analysis: Volume 38
  • PDF
  • German
  • Year: 1995
  • Author: Robert L. Snyder, Bin-Jiang Chen (auth.), Paul K. Predecki, D. Keith Bowen, John V. Gilfrich, Charles C. Goldsmith, Ting C. Huang, Ron Jenkins, I. Cev Noyan, Deane K. Smith (eds.)
Высокоразрешающая рентгеновская дифрактометрия и топография
  • DJVU
  • Russian
  • Year: 2002
  • Author: Боуэн Д.К., Таннер Б.К.(Bowen,Tanner)
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