High resolution X-ray diffractometry and topography
- Author
- D.K. Bowen, Brian K. Tanner
- Publisher
- Taylor & Francis
- Language
- English
- Edition
- 1
- Year
- 1998
- Page
- 278
- ISBN
- 0850667585,9780850667585,9780203979198
- File Type
- pdf
- File Size
- 8.3 MiB
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