Advances in X-Ray Analysis: Volume 38
- Author
- Robert L. Snyder, Bin-Jiang Chen (auth.), Paul K. Predecki, D. Keith Bowen, John V. Gilfrich, Charles C. Goldsmith, Ting C. Huang, Ron Jenkins, I. Cev Noyan, Deane K. Smith (eds.)
- Publisher
- Springer US
- Language
- German
- Year
- 1995
- Page
- 1995
- ISBN
- 978-0-306-45045-7,978-1-4615-1797-9
- File Type
- pdf
- File Size
- 51.1 MiB
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