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Flash MX ActionScript Designer’s Reference
  • PDF
  • English
  • Year: 2002
  • Author: Sham Bhangal, John Davey, Jen deHaan, Scott Mebberson, Tim Parker, Glen Rhodes (auth.)
Space Solar Physics: Theoretical and Observational Issues in the Context of the SOHO Mission Proceedings of a Summer School Held in Orsay, France, 1–13 September 1997
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  • English
  • Year: 1998
  • Author: Teodoro Roca Cortés (auth.), Jean Claude Vial, Karine Bocchialini, Patrick Boumier (eds.)
Chronischer Streß und koronares Risiko: wissenschaftliche Erkenntnisse und praktische Konsequenzen
  • PDF
  • German
  • Year: 1987
  • Author: Professor Dr. Johannes Siegrist (auth.), Professor Dr. Johannes Siegrist (eds.)
Determination of Air Quality: Proceedings of the ACS Symposium on the Determination of Air Quality held in Los Angeles, California, April 1–2, 1971
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  • English
  • Year: 1972
  • Author: G. B. Morgan, E. C. Tabor, R. J. Thompson (auth.), Gleb Mamantov, W. D. Shults (eds.)
Multigrid Methods: Proceedings of the Conference Held at Köln-Porz, November 23–27, 1981
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  • English
  • Year: 1982
  • Author: Klaus Stüben, Ulrich Trottenberg (auth.), W. Hackbusch, U. Trottenberg (eds.)
Knowledge Management In Action: IFIP 20th World Computer Congress, Conference on Knowledge Management in Action, September 7-10, 2008, Milano, Italy
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  • English
  • Year: 2008
  • Author: Laurence Prusak (auth.), Mark Ackerman, Rose Dieng-Kuntz, Carla Simone, Volker Wulf (eds.)
Systematisierung der Investitionsplanung für Industrieunternehmen
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  • German
  • Year: 1972
  • Author: Prof. Dr.-Ing. Dres. h. c. Herwart Opitz, Priv.-Doz. Dr.-Ing. Hans Peter Wiendahl, Dr.-Ing. Jürgen Schleppegrell, Dr.-Ing. Wolfgang Junghanns (auth.)
Globalization, Technological Change, and Labor Markets
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  • English
  • Year: 1998
  • Author: Stanley W. Black (auth.), Stanley W. Black (eds.)
Qualitätskontrolle in der Fertigungsindustrie mit Hilfe von EDV-Anlagen
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  • German
  • Year: 1973
  • Author: Dr.-Ing. Albert Bauer, Dipl.-Ing. Rolf Meier, Dipl.-Ing., Dipl.-Wirtsch.-Ing. Hartmut Richter, Dr.-Ing. Hans-Peter Sieper (auth.)