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Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development

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English
Year: 1998
Author: Way Kuo, Wei-Ting Kary Chien, Taeho Kim (auth.)

Importance Measures in Reliability, Risk, and Optimization: Principles and Applications

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English
Year: 2012
Author: Way Kuo, Xiaoyan Zhu(auth.)

Critical Reflections on Nuclear and Renewable Energy: Environmental Protection and Safety in the Wake of the Fukushima Nuclear Accident

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English
Year: 2014
Author: Way Kuo

Advances in Multimedia Modeling: 17th International Multimedia Modeling Conference, MMM 2011, Taipei, Taiwan, January 5-7, 2011, Proceedings, Part I

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English
Year: 2011
Author: Ling Shao, Hui Zhang, Yan Liu (auth.), Kuo-Tien Lee, Wen-Hsiang Tsai, Hong-Yuan Mark Liao, Tsuhan Chen, Jun-Wei Hsieh, Chien-Cheng Tseng (eds.)

Computational Intelligence in Reliability Engineering: Evolutionary Techniques in Reliability Analysis and Optimization

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English
Year: 2007
Author: Way Kuo, Rui Wan (auth.), Dr. Gregory Levitin (eds.)

Advances in Multimedia Modeling: 17th International Multimedia Modeling Conference, MMM 2011, Taipei, Taiwan, January 5-7, 2011, Proceedings, Part II

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English
Year: 2011
Author: Guangyu Zhu, Shuicheng Yan, Tony X. Han, Changsheng Xu (auth.), Kuo-Tien Lee, Wen-Hsiang Tsai, Hong-Yuan Mark Liao, Tsuhan Chen, Jun-Wei Hsieh, Chien-Cheng Tseng (eds.)

Atomic Information Technology: Safety and Economy of Nuclear Power Plants

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English
Year: 2012
Author: Taeho Woo (auth.)

CMOS VLSI Engineering: Silicon-on-Insulator (SOI)

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English
Year: 1998
Author: James B. Kuo, Ker-Wei Su (auth.)

Real-Time Database Systems: Architecture and Techniques

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English
Year: 2002
Author: Tei-Wei Kuo, Kam-Yiu Lam (auth.), Kam-Yiu Lam, Tei-Wei Kuo (eds.)

Fragment question and ellipsis in Chinese

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Chinese-English
Author: Ting-Chi Wei.