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Nanoscale Thin Film Analysis: Fundamentals and Techniques
  • PDF
  • English
  • Year: 2007
  • Author: Terry L. Alford, L.C. Feldman, James W. Mayer
Fundamentals of Nanoscale Film Analysis
  • PDF
  • English
  • Year: 2007
  • Author: Terry L. Alford, Leonard C. Feldman, James W. Mayer (auth.)
Silver metallization : stability and reliability
  • PDF
  • English
  • Year: 2008
  • Author: Daniel Adams; Terry L Alford; James W Mayer
Silver metallization : stability and reliability
  • PDF
  • English
  • Year: 2008
  • Author: Daniel Adams; Terry L Alford; James W Mayer
Fundamentals of nanoscale film analysis
  • PDF
  • English
  • Year: 2007
  • Author: Alford T.L., Feldman L.C., Mayer J.W.
Silver Metallization: Stability and Reliability
  • PDF
  • English
  • Year: 2008
  • Author: Daniel Adams PhD, Terry L. Alford PhD, James W. Mayer PhD (auth.)
Materials Analysis by Ion Channeling. Submicron crystallography
  • DJVU
  • English
  • Year: 1982
  • Author: Feldman L.C., Mayer J.W., Picraux S.T.
Fundamentals of Surface and Thin Film Analysis
  • PDF
  • English
  • Year: 1986
  • Author: L. C. Feldman, J. W. Mayer
In the Houses of Their Dead: The Lincolns, the Booths, and the Spirits
  • EPUB
  • English
  • Year: 2022
  • Author: Terry Alford
New Uses of Ion Accelerators
  • PDF
  • English
  • Year: 1975
  • Author: Thomas A. Cahill, James A. Cairns, Wei-Kan Chu, Billy L. Crowder, Geoffrey Dearnaley, Leonard C. Feldman, Quentin Kessel, James W. Mayer, Otto Meyer, Samuel T. Picraux, Winthrop W. Smith, Eligius A. Wolicki, James F. Ziegler (auth.), James F. Ziegler (eds.)
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