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Nanoscale Thin Film Analysis: Fundamentals and Techniques
  • PDF
  • English
  • Year: 2007
  • Author: Terry L. Alford, L.C. Feldman, James W. Mayer
Fundamentals of Nanoscale Film Analysis
  • PDF
  • English
  • Year: 2007
  • Author: Terry L. Alford, Leonard C. Feldman, James W. Mayer (auth.)
Silver metallization : stability and reliability
  • PDF
  • English
  • Year: 2008
  • Author: Daniel Adams; Terry L Alford; James W Mayer
Silver metallization : stability and reliability
  • PDF
  • English
  • Year: 2008
  • Author: Daniel Adams; Terry L Alford; James W Mayer
Silver Metallization: Stability and Reliability (Engineering Materials and Processes)
  • PDF
  • English
  • Year: 2007
  • Author: Daniel Adams, Terry L Alford, James W Mayer
Silver Metallization: Stability and Reliability
  • PDF
  • English
  • Year: 2007
  • Author: Daniel Adams, Terry L. Alford, James W. Mayer
Fundamentals of nanoscale film analysis
  • PDF
  • English
  • Year: 2007
  • Author: Alford T.L., Feldman L.C., Mayer J.W.
Silver Metallization: Stability and Reliability
  • PDF
  • English
  • Year: 2008
  • Author: Daniel Adams PhD, Terry L. Alford PhD, James W. Mayer PhD (auth.)
Materials Analysis by Ion Channeling. Submicron crystallography
  • DJVU
  • English
  • Year: 1982
  • Author: Feldman L.C., Mayer J.W., Picraux S.T.
Fundamentals of Surface and Thin Film Analysis
  • PDF
  • English
  • Year: 1986
  • Author: L. C. Feldman, J. W. Mayer
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