Fundamentals of Nanoscale Film Analysis
- Author
- Terry L. Alford, Leonard C. Feldman, James W. Mayer (auth.)
- Publisher
- Springer US
- Language
- English
- Edition
- 1
- Year
- 2007
- Page
- 336
- ISBN
- 978-0-387-29260-1,978-0-387-29261-8
- File Type
- pdf
- File Size
- 5.2 MiB
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