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Security Aspects in Information Technology: First International Conference, InfoSecHiComNet 2011, Haldia, India, October 19-22, 2011. Proceedings
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  • Year: 2011
  • Author: Sanjay Burman (auth.), Marc Joye, Debdeep Mukhopadhyay, Michael Tunstall (eds.)
Security Aspects in Information Technology: First International Conference, InfoSecHiComNet 2011, Haldia, India, October 19-22, 2011. Proceedings
  • PDF
  • English
  • Year: 2011
  • Author: Sanjay Burman (auth.), Marc Joye, Debdeep Mukhopadhyay, Michael Tunstall (eds.)
Fault Analysis in Cryptography
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  • Year: 2012
  • Author: Elisabeth Oswald, François-Xavier Standaert (auth.), Marc Joye, Michael Tunstall (eds.)
Fault Analysis in Cryptography
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  • Year: 2012
  • Author: Elisabeth Oswald, François-Xavier Standaert (auth.), Marc Joye, Michael Tunstall (eds.)
Security, Privacy, and Applied Cryptography Engineering: Third International Conference, SPACE 2013, Kharagpur, India, October 19-23, 2013. Proceedings
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  • Year: 2013
  • Author: Patrick Schaumont, Aydin Aysu (auth.), Benedikt Gierlichs, Sylvain Guilley, Debdeep Mukhopadhyay (eds.)
Security, Privacy, and Applied Cryptography Engineering: Third International Conference, SPACE 2013, Kharagpur, India, October 19-23, 2013. Proceedings
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  • Year: 2013
  • Author: Patrick Schaumont, Aydin Aysu (auth.), Benedikt Gierlichs, Sylvain Guilley, Debdeep Mukhopadhyay (eds.)
Timing Channels in Cryptography: A Micro-Architectural Perspective
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  • Year: 2015
  • Author: Chester Rebeiro, Debdeep Mukhopadhyay, Sarani Bhattacharya (auth.)
Pairing-Based Cryptography - Pairing 2010: 4th International Conference, Yamanaka Hot Spring, Japan, December 2010. Proceedings
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  • Year: 2010
  • Author: Kristin Lauter, Peter L. Montgomery, Michael Naehrig (auth.), Marc Joye, Atsuko Miyaji, Akira Otsuka (eds.)
Pairing-Based Cryptography - Pairing 2010: 4th International Conference, Yamanaka Hot Spring, Japan, December 2010. Proceedings
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  • English
  • Year: 2010
  • Author: Kristin Lauter, Peter L. Montgomery, Michael Naehrig (auth.), Marc Joye, Atsuko Miyaji, Akira Otsuka (eds.)