Fault Analysis in Cryptography
- Author
- Elisabeth Oswald, François-Xavier Standaert (auth.), Marc Joye, Michael Tunstall (eds.)
- Publisher
- Springer-Verlag Berlin Heidelberg
- Language
- English
- Edition
- 1
- Year
- 2012
- Page
- 356
- ISBN
- 978-3-642-29655-0,978-3-642-29656-7
- File Type
- pdf
- File Size
- 6.6 MiB
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