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Software Process Definition and Management
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  • English
  • Year: 2012
  • Author: Jürgen Münch, Ove Armbrust, Martin Kowalczyk, Martín Soto (auth.)
Aligning Organizations Through Measurement: The GQM+Strategies Approach
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  • English
  • Year: 2014
  • Author: Victor Basili, Adam Trendowicz, Martin Kowalczyk, Jens Heidrich, Carolyn Seaman, Jürgen Münch, Dieter Rombach (auth.)
Thermodynamik: Eine Einführung
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  • German
  • Year: 2015
  • Author: Günter Jakob Lauth, Jürgen Kowalczyk (auth.)
Einführung in die Physik und Chemie der Grenzflächen und Kolloide
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  • German
  • Year: 2016
  • Author: Günter Jakob Lauth, Jürgen Kowalczyk (auth.)
Perspectives on the Future of Software Engineering: Essays in Honor of Dieter Rombach
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  • English
  • Year: 2013
  • Author: Dieter Rombach (auth.), Jürgen Münch, Klaus Schmid (eds.)
Product-Focused Software Process Improvement: 7th International Conference, PROFES 2006, Amsterdam, The Netherlands, June 12-14, 2006. Proceedings
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  • English
  • Year: 2006
  • Author: Michiel van Genuchten (auth.), Jürgen Münch, Matias Vierimaa (eds.)
Product-Focused Software Process Improvement: 8th International Conference, PROFES 2007, Riga, Latvia, July 2-4, 2007. Proceedings
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  • English
  • Year: 2007
  • Author: H. Dieter Rombach (auth.), Jürgen Münch, Pekka Abrahamsson (eds.)
New Modeling Concepts for Today’s Software Processes: International Conference on Software Process, ICSP 2010, Paderborn, Germany, July 8-9, 2010. Proceedings
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  • English
  • Year: 2010
  • Author: Barry W. Boehm (auth.), Jürgen Münch, Ye Yang, Wilhelm Schäfer (eds.)
New Modeling Concepts for Today’s Software Processes: International Conference on Software Process, ICSP 2010, Paderborn, Germany, July 8-9, 2010. Proceedings
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  • English
  • Year: 2010
  • Author: Barry W. Boehm (auth.), Jürgen Münch, Ye Yang, Wilhelm Schäfer (eds.)
New Modeling Concepts for Today’s Software Processes: International Conference on Software Process, ICSP 2010, Paderborn, Germany, July 8-9, 2010. Proceedings
  • PDF
  • English
  • Year: 2010
  • Author: Barry W. Boehm (auth.), Jürgen Münch, Ye Yang, Wilhelm Schäfer (eds.)
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