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Materials Analysis by Ion Channeling. Submicron crystallography
  • DJVU
  • English
  • Year: 1982
  • Author: Feldman L.C., Mayer J.W., Picraux S.T.
Fundamentals of nanoscale film analysis
  • PDF
  • English
  • Year: 2007
  • Author: Alford T.L., Feldman L.C., Mayer J.W.
Nanoscale Thin Film Analysis: Fundamentals and Techniques
  • PDF
  • English
  • Year: 2007
  • Author: Terry L. Alford, L.C. Feldman, James W. Mayer
On the joint influence of iron and aluminium in native sands on mortar strength
  • PDF
  • English
  • Year: 1929
  • Author: Leavitt H.V., Gowen J.W., Jennes L.C.
New Uses of Ion Accelerators
  • PDF
  • English
  • Year: 1975
  • Author: Thomas A. Cahill, James A. Cairns, Wei-Kan Chu, Billy L. Crowder, Geoffrey Dearnaley, Leonard C. Feldman, Quentin Kessel, James W. Mayer, Otto Meyer, Samuel T. Picraux, Winthrop W. Smith, Eligius A. Wolicki, James F. Ziegler (auth.), James F. Ziegler (eds.)
Fundamentals of Surface and Thin Film Analysis
  • PDF
  • English
  • Year: 1986
  • Author: L. C. Feldman, J. W. Mayer
The Wisdom in Feeling: Psychological Processes in Emotional Intelligence
  • PDF
  • English
  • Year: 2002
  • Author: Lisa Feldman Barrett PhD, Peter Salovey PhD, John D. Mayer
Fundamentals of Nanoscale Film Analysis
  • PDF
  • English
  • Year: 2007
  • Author: Terry L. Alford, Leonard C. Feldman, James W. Mayer (auth.)
Тонкие пленки. Взаимная диффузия и реакции
  • DJVU
  • Russian
  • Year: 1982
  • Author: Поут Дж., Ту К., Мейер Дж.(Poate J.M., Tu K.N., Mayer J.W.)