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Hierarchical Modeling for VLSI Circuit Testing
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  • English
  • Year: 1990
  • Author: Debashis Bhattacharya, John P. Hayes (auth.)
Layout Minimization of CMOS Cells
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  • English
  • Year: 1992
  • Author: Robert L. Maziasz, John P. Hayes (auth.)
Einstein Relation in Compound Semiconductors and their Nanostructures
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  • English
  • Year: 2009
  • Author: Kamakhya Prasad Ghatak Dr., Sitangshu Bhattacharya Dr., Debashis De Dr. (auth.)
Basic Electrical and Electronics Engineering – I : For WBUT
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  • English
  • Year: 2010
  • Author: S. K. Bhattacharya, Debashis De
Design, Analysis and Test of Logic Circuits Under Uncertainty
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  • English
  • Year: 2013
  • Author: Smita Krishnaswamy, Igor L. Markov, John P. Hayes (auth.)
Design, Analysis and Test of Logic Circuits Under Uncertainty
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  • English
  • Year: 2013
  • Author: Smita Krishnaswamy, Igor L. Markov, John P. Hayes (auth.)
Making Trade Policy in the European Community
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  • English
  • Year: 1993
  • Author: J. P. Hayes (auth.)
Dignaga on the Interpretation of Signs
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  • English
  • Year: 1988
  • Author: Richard P. Hayes (auth.)
Network Marketing For Dummies
  • EPUB
  • English
  • Year: 2011
  • Author: Zig Ziglar, John P. Hayes