Design, Analysis and Test of Logic Circuits Under Uncertainty
- Author
- Smita Krishnaswamy, Igor L. Markov, John P. Hayes (auth.)
- Publisher
- Springer Netherlands
- Language
- English
- Edition
- 1
- Year
- 2013
- Page
- 124
- ISBN
- 978-90-481-9643-2,978-90-481-9644-9
- File Type
- pdf
- File Size
- 3.4 MiB
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