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Defect and Fault Tolerance in VLSI Systems: Volume 2

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English
Year: 1990
Author: C. H. Stapper (auth.), C. H. Stapper, V. K. Jain, G. Saucier (eds.)

Defect and Fault Tolerance in VLSI Systems: Volume 1

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English
Year: 1989
Author: Israel Koren, Charles H. Stapper (auth.), Israel Koren (eds.)

Plant Breeding: Mendelian to Molecular Approaches

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English
Year: 2004
Author: H. K. Jain (auth.), H K Jain, M C Kharkwal (eds.)

Pattern Recognition and Machine Intelligence: First International Conference, PReMI 2005, Kolkata, India, December 20-22, 2005. Proceedings

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English
Year: 2005
Author: Anil K. Jain, Martin H. C. Law (auth.), Sankar K. Pal, Sanghamitra Bandyopadhyay, Sambhunath Biswas (eds.)

Super Field Theories

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English
Year: 1988
Author: Lars Brink (auth.), H. C. Lee, V. Elias, G. Kunstatter, R. B. Mann, K. S. Viswanathan (eds.)

Das essential facility Prinzip und seine Verwendung zur Öffnung immaterialgüterrechtlich geschützter de facto Standards für den Wettbewerb

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German
Year: 2003
Author: Stapper, Thilo

Advanced Computational Intelligence Paradigms in Healthcare-2

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English
Year: 2007
Author: H. Yoshida, S. Vaidya, L. C. Jain (auth.), S. Vaidya, L. C. Jain, H. Yoshida (eds.)

Lipid-Lowering Therapy and Progression of Coronary Atherosclerosis

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English
Year: 1996
Author: T. J. C. Van Berkel (auth.), Albert V. G. Bruschke, Johan H. C. Reiber, K. I. Lie, Hein J. J. Wellens (eds.)

Magnetic Resonance: Proceedings of the International Symposium on Electron and Nuclear Magnetic Resonance, held in Melbourne, August 1969, sponsored by the Australian Academy of Science

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English
Year: 1995
Author: J. H. Van Vleck (auth.), C. K. Coogan, Norman S. Ham, S. N. Stuart, J. R. Pilbrow, G. V. H. Wilson (eds.)

Optical Information Technology: State-of-the-Art Report

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English
Year: 1993
Author: K.-H. Schlaad, Ch. Weber, U. Zimmermann, G. Weimann, C. v. Hoof, G. Borghs (auth.), S. Desmond Smith, Roderick F. Neale (eds.)