Defect and Fault Tolerance in VLSI Systems: Volume 1
- Author
- Israel Koren, Charles H. Stapper (auth.), Israel Koren (eds.)
- Publisher
- Springer US
- Language
- English
- Edition
- 1
- Year
- 1989
- Page
- 362
- ISBN
- 978-1-4615-6801-8,978-1-4615-6799-8
- File Type
- pdf
- File Size
- 12.4 MiB
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