Control Charts and Machine Learning for Anomaly Detection in Manufacturing

Control Charts and Machine Learning for Anomaly Detection in Manufacturing

Author
Kim Phuc Tran
Publisher
Springer
Language
English
Edition
1
Year
2021
Page
275
ISBN
3030838188,9783030838188
File Type
epub
File Size
30.3 MiB

This book introduces the latest research on advanced control charts and new machine learning approaches to detect abnormalities in the smart manufacturing process. By approaching anomaly detection using both statistics and machine learning, the book promotes interdisciplinary cooperation between the research communities, to jointly develop new anomaly detection approaches that are more suitable for the 4.0 Industrial Revolution.
The book provides ready-to-use algorithms and parameter sheets, enabling readers to design advanced control charts and machine learning-based approaches for anomaly detection in manufacturing. Case studies are introduced in each chapter to help practitioners easily apply these tools to real-world manufacturing processes.
The book is of interest to researchers, industrial experts, and postgraduate students in the fields of industrial engineering, automation, statistical learning, and manufacturing industries.

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