Recent Advances in PMOS Negative Bias Temperature Instability: Characterization and Modeling of Device Architecture, Material and Process Impact
- Author
- Souvik Mahapatra
- Publisher
- Springer
- Language
- English
- Year
- 2021
- Page
- 334
- ISBN
- 9811661197,9789811661198
- File Type
- pdf
- File Size
- 17.1 MiB
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