- Author
- Jiang Hsieh
- Publisher
- SPIE--The International Society for Optical Engineering
- Language
- English
- Edition
- 2nd Revised
- Year
- 2009
- Page
- 560
- ISBN
- 9780819475336,2009004797,9780470563533,0819475335
- File Type
- File Size
- 38.2 MiB
X-ray computer tomography (CT) continues to experience rapid growth, both in basic technology and new clinical applications. This book provides an overview of the evolution of CT, the mathematical and physical aspects of the technology, and the fundamentals of image reconstruction algorithms.
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