Applications and Metrology at Nanometer Scale 2: Measurement Systems, Quantum Engineering and RBDO Method
- Author
- Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
- Publisher
- Wiley-ISTE
- Language
- English
- Year
- 2022
- Page
- 268
- ISBN
- 2020950471,9781786306876
- File Type
- pdf
- File Size
- 8.3 MiB
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