Atomic Force Microscopy for Energy Research

Atomic Force Microscopy for Energy Research

Author
Cai Shen
Publisher
CRC Press
Language
English
Year
2022
Page
456
ISBN
103200407X,9781032004075
File Type
pdf
File Size
51.5 MiB

Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials―such as lithium-ion batteries, solar cells, and other energy-related materials―are addressed.
FEATURES
First book to focus on application of AFM for energy research
Details the use of advanced AFM and addresses many types of functional AFM tools
Enables readers to operate an AFM instrument successfully and to understand the data obtained
Covers new achievements in AFM instruments, including electrochemical strain microscopy, and how AFM is being combined with other new methods such as infrared (IR) spectroscopy
With its substantial content and logical structure, Atomic Force Microscopy for Energy Research is a valuable reference for researchers in materials science, chemistry, and physics who are working with AFM or planning to use it in their own fields of research, especially energy research.

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