Technology Assessment in a Globalized World: Facing the Challenges of Transnational Technology Governance
- Author
- Leonhard Hennen, Julia Hahn, Miltos Ladikas, Ralf Lindner, Walter Peissl, Rinie van Est
- Publisher
- Springer
- Language
- English
- Year
- 2023
- Page
- 271
- ISBN
- 3031106164,9783031106163
- File Type
- pdf
- File Size
- 4.0 MiB
How to Download?!!!
Just click on START button on Telegram Bot