Next Generation Technology-Enhanced Assessment: Global Perspectives on Occupational and Workplace Testing
- Author
- John C. Scott (editor), Dave Bartram (editor), Douglas H. Reynolds (editor)
- Publisher
- Cambridge University Press
- Language
- English
- Year
- 2017
- Page
- 440
- ISBN
- 1107124360,9781107124363,9781316407547
- File Type
- pdf
- File Size
- 29.5 MiB
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