Electromigration in Metals: Fundamentals to Nano-Interconnects
- Author
- Paul S. Ho, Chao-Kun Hu, Martin Gall, Valeriy Sukharev
- Publisher
- Cambridge University Press
- Language
- English
- Edition
- 1
- Year
- 2022
- Page
- 430
- ISBN
- 1107032385,9781107032385
- File Type
- pdf
- File Size
- 17.6 MiB
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