Extreme Ultraviolet Lithography

Extreme Ultraviolet Lithography

Author
Harry J. Levinson
Publisher
SPIE--The International Society for Optical Engineering
Language
English
Year
2020
Page
245
ISBN
151063939X,9781510639393
File Type
pdf
File Size
6.1 MiB

This book covers the many aspects of lithographic technology that needed to be addressed in order to make EUV lithography ready for high-volume manufacturing: exposure tools, light sources, masks, resists, process control, metrology, and computational lithography. Lithography costs, which have often influenced the areas of technical focus, are discussed. Potential improvements to current EUV technology and extensions to future nodes are also covered. Each topic is approached from the perspective of a practicing lithographer in a wafer fab, in either manufacturing or development, and there are many references at the end of each chapter.

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