Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design: A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach
- Author
- Xiaowei Li, Guihai Yan, Cheng Liu
- Publisher
- Springer
- Language
- English
- Year
- 2023
- Page
- 317
- ISBN
- 9811985502,9789811985508
- File Type
- pdf
- File Size
- 11.8 MiB
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