- Author
- Daniel J. D. SullivanEric J. Carleton
- Publisher
- De Gruyter
- Language
- English
- Year
- 2022
- Page
- 128
- ISBN
- 9781501524790,9781501524783
- File Type
- epub
- File Size
- 9.0 MiB
The Book Presents A Unique View Of Failure Analysis Of High Technology Devices. It Describes Capabilities And Limitations Of Many Analytical Techniques And Testing Paths And Decisions Best Followed In Example Failure Analysis Studies.
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