Reliability and Failure of Electronic Materials and Devices
- Author
- Milton Ohring
- Publisher
- Academic Press
- Language
- English
- Edition
- 1st
- Year
- 1998
- Page
- 715
- ISBN
- 0-12-524985-3,0-12-524985-3,978-0-12-524985-0
- File Type
- pdf
- File Size
- 30.7 MiB
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