Thin-walled structures with structural imperfections: analysis and behavior
- Author
- J.Y. Richard Liew, V. Thevendran, N.E. Shanmugam
- Publisher
- Pergamon
- Language
- English
- Edition
- 1st ed
- Year
- 1998
- Page
- 841
- ISBN
- 0080430031,9780080430034,9780080552057,0080422667
- File Type
- pdf
- File Size
- 38.2 MiB
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