Physical Principles of Electron Microscopy An Introduction to TEM SEM and AEM
- Author
- R. Egerton
- Publisher
- Springer
- Language
- English
- Year
- 2008
- Page
- 211
- ISBN
- 0-387-25800-0,978-0387-25800-0
- File Type
- pdf
- File Size
- 5.6 MiB
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