Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching: application to rough and natural surfaces
- Author
- Gerd Kaupp
- Publisher
- Springer
- Language
- English
- Edition
- 1
- Year
- 2006
- Page
- 302
- ISBN
- 3540284052,9783540284055
- File Type
- pdf
- File Size
- 17.9 MiB
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