Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
- Author
- Jose Nazario
- Publisher
- Springer
- Language
- English
- Edition
- 2nd
- Year
- 2007
- Page
- 340
- ISBN
- 9781580535373,1580535372
- File Type
- pdf
- File Size
- 5.8 MiB
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