Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: the system on chip approach
- Author
- Y. Sun, Yichuang Sun
- Publisher
- IET
- Language
- English
- Year
- 2007
- Page
- 411
- ISBN
- 0863417450,9780863417450
- File Type
- pdf
- File Size
- 3.3 MiB
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