Pattern Recognition: 28th DAGM Symposium, Berlin, Germany, September 12-14, 2006. Proceedings

Author: Yael Erez, Yoav Y. Schechner, Dan Adam (auth.), Katrin Franke, Klaus-Robert Müller, Bertram Nickolay, Ralf Schäfer (eds.)
Publisher: Springer-Verlag Berlin Heidelberg
Language: English
Edition: 1
Year: 2006
Page: 784
ISBN: 3540444122,9783540444121
File Type: pdf
File Size: 49.6 MiB

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