Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)
- Author
- Nicola Nicolici, Bashir M. Al-Hashimi
- Language
- English
- Edition
- 1st
- Year
- 2000
- Page
- 259
- ISBN
- 0071358854,9781402073502,9780071358859,140207235X,9781402072352
- File Type
- pdf
- File Size
- 10.6 MiB
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