Wafer-Level Testing and Test During Burn-In for Integrated Circuits
- Author
- Sudarshan Bahukudumbi, Krishnendu Chakrabarty
- Publisher
- Artech House Publishers
- Language
- English
- Edition
- 1
- Year
- 2010
- Page
- 215
- ISBN
- 1596939893,9781596939899
- File Type
- pdf
- File Size
- 2.9 MiB
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