Fatigue Testing, Analysis, and Design: Theory and Applications
- Author
- Yung-Li Lee, Jwo Pan, Richard Hathaway, Mark Barkey
- Publisher
- Butterworth-Heinemann
- Language
- English
- Edition
- 1
- Year
- 2004
- Page
- 417
- ISBN
- 9780750677196,0750677198
- File Type
- pdf
- File Size
- 6.8 MiB
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